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Accuracy evaluation in temperature-dependent EXafs measurements of CdTe

The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed.


Auteur(s) : N. Abd el Ali, B. Thiodjio Sendja, R. Grisenti, F. Rocca, D. Diop, O. Mathon, S. Pascarelli and P. Fornasini
Pages : 603-613
Année de publication : 2013
Revue : Journal of Synchrotron Radiation
N° de volume : 20
Type : Article
Mise en ligne par : DIOP Djibril